Keep "in the know" by following our TwitterFacebookLinkedIn, and Instagram
Use #dxc2017 as your hashtag!

Big Sky Resort, Big Sky, Montana, USA, 31 July – 4 August 2017





program
Click for PDF version

Program Notice: The information contained in this PDF is current as of July 2017. Any changes will be communicated on the Program page of the DXC website by viewing the quick links for the workshop and session information. Updates to Program will also be noted on the conference mobile App, Guidebook, and the Late Announcements posted at the conference.

2017 Denver X-ray Conference Program Quick Links:

Program at a glance

Monday Morning Workshops

Monday Afternoon Workshops

XRD Poster Session - Monday pm

Tuesday Morning Workshops

Tuesday Afternoon Workshops

XRF Poster Session - Tuesday pm

Plenary Session - Wednesday am

Oral Sessions:
Wednesday pm
Thursday am
Thursday pm

Friday am


Please Note: Denver X-ray Conference/ICDD does not permit any type of recording (photography, video, audio, etc.) of lectures, posters, tutorials, workshops and commercial exhibits at the Denver X-ray Conference without prior permission of ICDD or the individuals/entity involved.

Monday Morning Workshops 9:00 am – 12:00 Noon

Getting Started at User Facilities (North Mammoth)
Organizer & Instructors:
S.H. Lapidus, APS – Argonne National Laboratory, USA, slapidus@aps.anl.gov
A. Huq, Spallation Neutron Source - Oak Ridge National Laboratory, USA, huq@ornl.gov
J. Wright, Illinois Institute of Technology, USA, jwright@csri.iit.edu
K.H. Stone, SLAC – Stanford University, USA, khstone@slac.stanford.edu

This workshop will introduce the capabilities of user facilities, with particular focus on synchrotrons and neutron facilities. Topics covered will include designing experiments, synchrotron PXRD, neutron PXRD, X-ray fluorescence, EXAFS, various other diffraction techniques (such as grazing incidence, thin film, etc.), and how to write a proposal for a user facility. This course does not suppose any knowledge of user facilities, but does suppose a basic knowledge of diffraction and/or fluorescence.

Specimen Preparation of XRD (Amphitheatre)
Organizer & Instructors:
T. Fawcett, International Centre for Diffraction Data, USA, dxcfawcett@outlook.com
S. Quick, Pennsylvania State University, USA, quick@cse.psu.edu
M. Rodriguez, Sandia National Laboratory, USA, marodri@sandia.gov

Specimen preparation is often the limiting step for obtaining good results in a diffraction experiment. Preparation methods can influence the accuracy and precision of peak positions, intensities and profile. These are the basic measurements required for qualitative and quantitative analysis. The presentation will focus on crystallite and particle effects, orientation and texture, particle statistics and how various preparation methods can reduce or eliminate these influences.
We will also focus on "tricks of the trade" and various techniques that experts use to analyze odd shaped parts, limited samples, as well as, air and moisture sensitive specimens.

Basic XRF (South Mammoth)
Organizer & Instructors:
A. Drews, Ford Motor Company, USA, adrews@ford.com
K. Kawakyu, Rigaku Corporation, Japan, kawakyu@rigaku.co.jp

This workshop provides a basic introduction to the principles of XRF specifically aimed at those new to the field. In the first half, there will be a general overview of the XRF technique, including a discussion of the basic principles of X-ray interactions with matter. The emphasis in the first half will be on understanding the underlying physical phenomena, how the technique is applied, optimization of the signal, and approaches to quantitative analysis. In the second half of the workshop, examples of real-world applications will be presented to illustrate some of the challenges and opportunities that the analyst may face. This half will describe a variety of specimen formats and demonstrate the flexibility of the XRF technique.

Trace Analysis Including TXRF (Cheyenne)
Organizers & Instructors:
P. Wobrauschek, C. Streli, TU Wien - Atominstitut, Austria, wobi@ati.ac.at, streli@ati.ac.at
R. Ayala, Fisichem, Inc., USA and Guatemala, rayala@fisichem.com
K. Tsuji, Osaka City University, Japan, tsuji@a-chem.eng.osaka-cu.ac.jp
N. Kawahara, Rigaku Corporation, Japan, kawahara@rigaku.co.jp

Both beginners and experienced X-ray scientists and applicants, physicists and chemists, should gain information by attending the Trace Analysis workshop. Presentations of most modern techniques and instrumentation for trace element analysis using EDXRS will be given. Physical methods to improve minimum detection limits in XRF by background reduction will be discussed; special emphasis will be on Synchrotron radiation as excitation source. Introduction to Total Reflection XRF (TXRF) and actual instrumentation will show achievable advantages and results in terms of detection limits, sensitivities and detectable elemental range down to light elements (eg.Carbon). Confocal μ-XRF will be presented as method for 2D and 3D spatial resolved elemental imaging. Applications from interesting scientific fields such as environment, microelectronics, forensic, and life science will show the successful use of the importance of the various XRF spectrometric techniques. The possibilities of trace analysis using Wavelength Dispersive XRF will also be covered, showing the benefits and limitations of the technique. A comparison of achievable detection limits with the various techniques on some specific samples will be discussed.

 

Monday Afternoon Workshops 1:30 pm – 4:30 pm

Stress (North Mammoth)
Organizers & Instructors:
I.C. Noyan, Columbia University, USA, icn2@columbia.edu
C. Murray, IBM T.J. Watson Research Center, USA, conal@us.ibm.com

This workshop is intended to introduce novice users to the basic techniques used in diffraction-based residual stress determination. Single exposure, sin2(psi), two-tilt and triaxial stress determination techniques will be introduced and instrumental errors associated with the measurement will be discussed. Examples will be provided that use both laboratory and synchrotron-based techniques, including microbeam measurements. At the end of the seminar, the attendees should be able to evaluate the validity of a diffraction-based stress determination experiment.

Polymers (Amphitheatre)
Organizers & Instructors:
B. Landes, Dow Chemical Company, USA, bglandes@dow.com
S. Murthy, Rutgers University, USA, murthy@biology.rutgers.edu

The workshop will introduce novices to polymer X-ray scattering and to reintroduce practitioners of the technique to the new developments in over the past decade. The workshop will cover both small- and wide-angle scattering, and discuss measurements that can be carried with in-house X-ray sources as well as at synchrotron radiation facilities. The workshop will start with basics of morphology and the crystalline characteristics of semi-
crystalline polymers, and instrumentation and principle of the measurement. Following topics will be covered with emphasis on topics of interest to the participants.
1. Methods of measuring relative and absolute crystallinity. Issues in the measurements of crystallinity: Background, amorphous halo, the
angular range, and preferred orientation. Separation of size and disorder effects.
2. Texture in polymers. Significance of orientation. Determination of orientation in polymers. Amorphous and crystalline orientation.
3. Small-angle X-ray scattering. Void scattering and size analysis. Lamellar and fibrillar structure in polymers.
4. Special techniques: Grazing-incidence measurements. Surface and thin films analysis. Reflectivity. GI-SAXS and GI –WAXS. Microdiffraction.
5. Synchrotron radiation and its use in polymer diffraction in-situ deformation and DSC.
Specific topics that are of broad interest and falling within the scope can be submitted for consideration in advance to the Organizers: Sanjeeva Murthy (Murthy@biology.rutgers.edu) and Brian Landes (BGLandes@dow.com).

Energy Dispersive XRF (South Mammoth)
Organizer & Instructors:
P. Lemberge, Thermo Fisher Scientific, Switzerland, pascal.lemberge@thermofisher.com
W.D. Watson, Thermo Fisher Scientific, USA, wayne.watson@thermofisher.com

This workshop is designed to provide a discussion of the theoretical and practical aspects of EDXRF spectrometry providing a comprehensive review of the basic fundamentals for both the beginner and experienced X-ray spectroscopist. Topics to be covered include excitation systems; detectors; components and their relation to EDXRF applicability; ease of use; rapid qualitative analysis and material screening; calibration techniques for quantitative analysis; standard-less analysis; sensitivity of EDXRF for a wide variety of elements in various matrices as well as sample preparation. We discuss some real-life application examples where EDXRF is being used to solve complex analytical problems. The major emphases will be on the applicability of EDXRF and the optimal protocol for generating and reporting of reliable experimental results.

Micro XRF (Cheyenne)
Organizer & Instructors:
K.C. Witherspoon, IXRF Systems, Inc., USA, kennyw@ixrfsystems.com
The MXRF workshop will provide an overview of micro X-ray fluorescence (MXRF) including a survey of applications and capabilities as well as an in-depth discussion on common components used in MXRF instruments. The workshop will explore quantitative analysis in addition to elemental imaging (mapping/scanning) as well as their particularities.

Tuesday Morning Workshops 9:00 am – 12 Noon

Rietveld Refinement using In Situ Powder Diffraction Data I (Amphitheatre)
Organizers & Instructors:
A. Yakovenko, APS – Argonne National Laboratory, USA, ayakovenko@aps.anl.gov
J.A. Kaduk, Polycrystallography, Inc., and Illinois Institute of Technology, USA, kaduk@polycrystallography.com
K.M. Wiaderek, S. Lapidus, APS – Argonne National Laboratory, USA, kwiaderek@aps.anl.gov, slapidus@aps.anl.gov

Software: GSAS-II
Today, structure determination and structure analysis of new materials is one of the routine tasks which needs to be performed in order to understand the materials properties. The majority of structure determinations are carried out by single crystal methods. Materials that are being used in the industrial and/or commercial settings are, however, generally in polycrystalline form. While new structure solution using powder diffraction data may be complicated, powder diffraction can be easily used for in situ and operando structural studies once structural models are known. This enables a better understanding of the material structure and microstructure, and their evolution at real applicable conditions. In situ powder diffraction methods should become a new popular second step after initial structure determination due to recent advantages in sequential and parametric Rietveld analysis.
The 2017 Rietveld Refinement workshop, in addition to "classical" single pattern data refinement, will be focused on strategies of in situ data processing. We will explore carbon monoxide oxidation process and will see what structural changes happens inside Cu/CuxO catalyst. About one quarter of the time will be spent describing how to use other structural techniques such as pair distribution function analysis (PDF) to extract structural information where the Rietveld method might not yield the desired results.

Handheld XRF – The Silver Bullet or Fool's Gold? (North Mammoth) - READ MORE ABOUT THIS WORKSHOP
Organizer & Instructors:
M. Loubser, GeoMagGeoChem, South Africa, maggi.loubser@gmail.com
N. Brand, Geochemical Services Pty Ltd, Australia, nwbrand@bigpond.net.au
S. Ridolfi, Ars Mensurae, Rome, Italy​, stefano@arsmensurae.it​ 

X-ray Fluorescence spectroscopy is a mature technique with the theory well described and routinely applied in process control, exploration, mining and manufacturing apart from research and development applications. The "big shrink" as in most analytical technologies was the result of improved electronics and computer chips, and together with the advance of the SDD detector Energy Dispersive XRF was ready to enter the playground. Handheld XRF moved from a metal sorting scanner to an actual quantitative analytical tool. But here lies the biggest challenge; because of reduced cost and ease of operation this tool is now more accessible to people who often do not have the insight in the limitations.

In this workshop, firstly the differences between analysis in the field vs. the laboratory would be explained, and methods to improve accuracy or interpret the data based on the know inaccuracies. Then some specific Geology case studies would be presented by Nigel Brand and lastly Stefano Ridolfi will introduce some case studies in the field of art and conservation where the ability to bring a non-destructive technique to the actual object probably had the biggest impact, but again, not without pitfalls.

Challenges in XRF Analysis: Sample Preparation, Spectral Interpretation and Soft X-ray Detection (South Mammoth)
Organizer & Instructors:
J. Kawai, Kyoto University, Japan, kawai.jun.3x@kyoto-u.ac.jp
Y. Uehara, Mitsubishi Electric Corporation, Japan, uehara.yasushi@aj.mitsubishielectric.co.jp
S. Ichikawa, Fukuoka University, Japan, sichikawa@fukuoka-u.ac.jp

This workshop provides a technical introduction on the following topics:
1. The sample preparation (sample amount, particle size for e.g. rice as received or pulverized based on escape depth of fluorescent X-ray, pressure to make a briquette, glass bead components and thickness, specimen diameter, synthetic standard for calibration curve, validation using reference materials ...)
2. Spectrometer settings (A/D conversion gain, smoothing, background subtraction, dwelling time, iteration time, WDX or EDX, X-ray intensity and counting rate, sum peak, escape peak, diffraction peak, shaping time ...)
3. Measurement conditions (sample thickness, monochromatic X-ray energy, incident X-ray beam angle ...) which will affect the results of quantitative and even qualitative results of XRF. Though synchrotron radiation XRF and EPMA are compared with ordinary laboratory or handheld XRF spectrometers, the workshop is intended to make use of ordinary laboratory XRF spectrometer's high reliability. This workshop is intended not only for XRF beginners but also for those already familiar with XRF measurements.


Quantitative Analysis I (Lamar/Gibbon)
Organizer & Instructors:
W.T. Elam, University of Washington, USA, wtelam@apl.washington.edu
B. Vrebos, PANalytical B.V., The Netherlands, bruno.vrebos@panalytical.com
K. Kawakyu, Rigaku Corporation, Japan, kawakyu@rigaku.co.jp
B. Scruggs, Ametek/EDAX, USA, Bruce.Scruggs@Ametek.com

Morning:
Matrix effects and how to compensate for them: scatter peaks, compensation methods, semi-quantitative analysis using FP, and fusion.

Afternoon:
Introduction to mathematics and physics of XRF quantification, including matrix effects, spectrum processing, artifacts, instrument settings, and element sensitivity & detection limits.

 

Tuesday Afternoon Workshops 1:30 pm – 4:30 pm


Strain & Phase Mapping of Industrial Materials & Processing by Synchrotron
North Mammoth
Organizer & Instructors:
T. Tsakalakos, Rutgers University, USA, tsakalak@gmail.com
J. Okasinski, APS - Argonne National Laboratory, USA, okasinski@aps.anl.gov
W.A. Paxton, Ford Motor Company, USA, wpaxton@ford.com

This workshop will focus on the general principles of strain and phase mapping using synchrotron radiation to interrogate a wide range of advanced engineering materials. X-ray diffraction can be utilized to systematically and comprehensively understand the effects of processing and the resultant evolution of structure on the overall mechanical properties, performance, and thermal stability for materials. Standardized procedures for the testing and analyses of size-dependent mechanical and functional properties at the nanoscale, which are essential for the design, modeling, and life assessment of advanced engineering materials for structural and functional applications, will also be addressed.

Unique experimental techniques, in particular energy dispersive X-ray diffraction (EDXRD), will be reviewed in this workshop for the in situ and ex situ characterization of the structure, residual stresses, and fracture and fatigue response. Systematic and well-executed experiments to investigate monotonic and cyclic deformation and failure across nanometer to macroscopic length scales are discussed in carefully chosen and synthesized model systems. We will discuss techniques to directly measure the residual stress tensor in materials as a function of depth, to correlate the residual stress profiling to deformation and fracture processes of advanced engineering materials and to relate deformation modes to structural parameters. (continued)

Rietveld Refinement using In Situ Powder Diffraction Data II (Amphitheatre)
Please see previous description from Rietveld Refinement using In Situ Powder Diffraction Data I

Sample Preparation of XRF (South Mammoth)
Organizer & Instructors:
J.A. Anzelmo, Anzelmo & Associates, Inc., USA, jaanzelmo@aol.com
J. Pitre, Claisse, Canada, jpitre@claisse.com

This workshop will begin with John Anzelmo discussing the fundamental physics of sample preparation, such as infinite thickness and effective layer thickness, particle size effects, mineralogical effects, grinding concepts, and how to make the basic laboratory operations involved in solving these problems for XRF specimen preparation of pressed powders and fusion beads. Janice Pitre will discuss basic and advanced fusion techniques, such as selection of flux for different applications, conditions that cause cracking in beads, and oxidation techniques for simple and difficult to flux materials.

Quantitative Analysis II (Lamar/Gibbon)
Please see previous description from Quantitative Analysis I

XRD Poster Session – Monday Evening (Huntley Dining Room)

The Monday evening XRD poster session will be held 5:00 pm – 7:00 pm
in the Huntley Dining Room, in conjunction with a wine and cheese reception.

Three "Best Poster" awards will be given at the end of the session, including "Best Student Poster".

Judges: T.R. Watkins, Oak Ridge National Laboratory, USA, watkinstr@ornl.gov
M.A. Rodriguez, Sandia National Laboratory, USA, marodri@sandia.gov

*Signifies presenting author, when noted

D-1 WITHDRAWN The Rietveld of Teaching Materials for Ceramic
J.R. Marques, J.F. dos R. Sobrinho, A.R. do N. Santos. A. de S. Brandim, Instituto Federal do Piauí - IFPI, Brasil
R. Barbosa, Universidade Federal do Piauí - UFPI, Brasil

D-2 Rietveld Analysis of X-ray Powder Diffraction Patterns of Zr-Based Alloy System
C. Silva, K. Leonard, Oak Ridge National Laboratory, USA
F. Ibrahim, Earlham College, USA

 

D-4 Structure Investigation of Lignin-based Polyurethanes using WAXS
K. Walbrueck, S. Klein, J. Rumpf, M. Schulze, S. Witzleben, Bonn-Rhein-Sieg University, Germany

D-6 Dilithium (Citrate) Crystals and Their Relatives
J.A. Kaduk, A.J. Cigler, North Central College, USA

D-7 Crystal Structures of Large-Volume Commercial Pharmaceuticals
J.A. Kaduk, Illinois Institute of Technology and North Central College, USA
A.M. Gindhart, T.N. Blanton, ICDD, USA

D-8 Determination of Crystallite Size and Strain: A Comparison of Different X-ray Diffraction Techniques
J. Shi, A. Takase, Rigaku Americas, USA

D-9 A High-Quality Non-Destructive XRD Technique for Cultural Heritage
G.M. Hansford*, S.M.R. Turner, University of Leicester, UK
P. Degryse, K.U. Leuven, Belgium
A.J. Shortland, Cranfield University, UK

D-14 Atom Dynamic of Amorphous Materials (Ni0.60Nb0.4)100-xZrx (x=0 to 30) by X-ray Photon Correlation Spectroscopy, Neutron Studies
S. Sarker, D. Chandra, Q. An, W.M. Chien, University of Nevada, Reno, USA
B. Ruta, European Synchrotron Radiation Facility, France
T.J. Udovic, NIST Center for Neutron Research, USA
G. King, Los Alamos National Laboratory, USA
D. Isheim, Northwestern University, USA

D-15 Finger Print Minerals for Provenance Estimation of Atamadai Type Pottery (2500-1500 BC) from Hinoki Site (Tochigi, Japan) using Powder XRD
S. Ichikawa*, M. Morikawa, T. Kurisaki, T. Yamaguchi, Fukuoka University, Japan

D-19 Residual Stress Analysis of Coated Carbides at Kennametal, Inc.
T. Shibata*, B. Sargent, Kennametal Inc., USA

D-25 Investigation of Polymer Coating Morphology with XRD
P. Ricou*, A. Du, Z. Cherian, Arkema, Inc., USA

D-26 WITHDRAWN Time Resolved X-ray Diffraction Study of Ultrasonically Levitated Droplets
Y.I. Kim, K.B. Kim, Y.H. Lee, Korea Research Institute of Standards and Science, Republic of Korea
K.M. Nam, Mokpo National University, Republic of Korea

D-30 Synchrotron Powder Diffraction Simplified: The High-Resolution Diffractometer 11-BM at the Advanced Photon Source
L. Ribaud, S. Lapidus, Argonne National Laboratory, USA

D-31 Materials Characterization Using Synchrotron Radiation Capabilities of the ICDD PDF-4 Databases
T. Blanton, T. Fawcett, J. Blanton, S. Kabekkodu, R. Papoular, ICDD, USA

D-32 Phase Transformation and Enhancement of Structural Properties on CdSe Films with Annealing in Air Atmosphere
J. Sarmiento, E. Rosendo, T. Díaz-Becerril, R. Romano-Trujillo, CIDS, BUAP, México
W. De la Cruz, CNYN, UNAM, México

D-33 Materials Characterization Using Neutron Radiation Capabilities of the ICDD PDF-4 Databases
T. Blanton*, J. Faber, J. Blanton, S. Kabekkodu, R. Papoular, ICDD, USA

D-35 Determination of Contrast Factors for Cubic Slip-Systems and their Application in the Microstructural Characterization of Binary Fm-3m Materials
D. Cavazos-Cavazos, F.F. Contreras-Torres, Tecnológico de Monterrey, Mexico

D-36 Hydrotalcites as a Carbon Sink in Serpentinites
C.C. Turvey*, S.A. Wilson, J.L. Hamilton, Monash University, Australia
J. McCutcheon, G. Southam, The University of Queensland, Australia
A. Beinlich, Curtin University, Australia
G.M. Dipple, The University of British Columbia, Canada

D-38 Determination of Clay Minerals by the Rietveld Refinement
M. Kasari*, D. Fukuda, K. Fujii, Y. Koike, Meiji University, Japan
A. Ohbuchi, Rigaku Corporation, Japan

D-39 WITHDRAWN Powder XRD Investigations and Structure Solution of ULS-1 - a New Layered Silicate Material
M.A. Miller, S.R. Miller, R.W. Broach, M.M. Galey, S. Prabhakar, B. Lyons, C.L. Nicholas*, C.P. Nicholas, Honeywell UOP, USA

D-50 Feasibility Study of Manufacturing TiAl Parts with Electron Beam Melting: A Pathway Towards Additively Manufacturing Complex Engine Components
E. Cakmak, P. Nandwana, T. Watkins, A. Haynes, Oak Ridge National Lab, USA
R. England, Cummins Inc., USA

D-51 WITHDRAWN Synthesis of Li-Sn-Zn Ternary Alloy
C. Saw, B. Choi, Lawrence Livermore Nat. Lab., USA

D-52 WITHDRAWN A New 3D Framework Supported in Dipolar and Cuadrupolar Interactions: Intercalation of Thiazole in Layered Solids
F. Echevarría, A.A. Lemus-Santana, M. González, E. Reguera, Research Institute in Advanced Science and Applied Technology, México
J. Rodríguez, Research Center in Advanced Chemistry, México

D-56 Porphyrins: Important Materials with Diverse Functionalities
L. Cook, G. Brewer, The Catholic University of America, USA
W. Wong-Ng, National Institute of Standards and Technology, USA

D-96 WITHDRAWN P- type Behavior of Antimony Doped ZnO Nanowires Studied By X-ray Absorption Spectroscopy and Photoluminescence
A.M. Alsmadi, B. Salameh, Kuwait University, Kuwait

D-61 WITHDRAWN Disordered and Non-crystalline Phase Quantification with Whole-pattern Fitting in Environmental Materials
T.J. Kane*, University of Colorado and U.S. Geological Survey, USA
K.M. Campbell, U.S. Geological Survey, USA

D-64 In Operando / Situ Data Collection and Advanced Data Analysis of a Commercial Li-Ion Battery During Charge/Discharge Cycles on a XRPD Laboratory Diffractometer
T. Degen, M. Gateshki, M. Sadki, D. Beckers, PANalytical B.V., The Netherlands

D-65 STOE STADI P and the MULTI-MYTHEN – The Solution if One Dectris MYTHEN 1K is Not Fast Enough
T. Hartmann, Stoe & Cie GmbH, Germany

D-67 Atomic Pair Distribution Function (PDF) and X-ray Scattering Methods to Assess the Stability of Amorphous Organic Compounds
D. Beckers, M. Gateshki, PANalytical B.V., The Netherlands
A. Adibhatla, PANalytical Inc., USA

D-70 Crystallite Size Analysis of Nanomaterials by Single Peak and Whole Pattern Fitting
J. Cowen, Case Western Reserve University, USA

D-71 The High-Temperature Stability and Crystal Structure of Cadmium-Doped Hydroxyapatite Powders
M. Shah, G. Gonzalez, DePaul University, USA

D-72 WITHDRAWN Relationships between Optical and DRX Characteristics of Cu+2/Fe+3 Mixed Oxides
S. Nieto-Zambrano, E. Ramos-Ramirez, University of Guanajuato, Mexico

D-73 How Low Can You Go? Exploring Lowest Detection Limits of Respirable Crystalline Silica
N. Rodesney*, N. Henderson, J. Giencke, B. Jones, Bruker AXS, USA

D-77 D2 PHASER Benchtop Diffractometer: New Components Boost Performance
N. Henderson*, S.N. Rodesney, J. Giencke, B. Jones, Bruker AXS, USA
A. Kern, Bruker AXS, Germany

D-81 Structural Characterization of GaN Layers Grown on Graded-AlGaN/GaN/c-Al2O3 Templates by HRXRD, GIXD, AFM and TEM
A. Kuchuk, H. Stanchu, Yu. Mazur, P. Lytvyn, C. Li, Y. Maidaniuk, M. Benamara, M. Ware, G. Salamo, University of Arkansas, USA
M. Schmidbauer, Leibniz-Institut für Kristallzüchtung, Germany

D-85 Shear Stress Measurement with Portable X-ray Device
S.Y. Lee, Columbia University, USA

D-88 Diffuse Scattering from Nanoparticles
S. Xiong, I.C. Noyan, Columbia University, USA

D-90 Method Development for X-ray Diffraction Analysis of Thin Powder Deposit Samples of Simulated Radioactive Tank Waste
T. Ely, H. Meznarich, T. Valero, G. Cooke, Washington River Protection Solutions LLC, USA

Moved to Thursday General XRD Session:
D-91 Alloying Large Organic Cations into the Perovskite Framework for Enhanced Thermal Stability and Transport Properties
W. Peng, X. Miao*, O.M. Bakr, King Abdullah University of Science and Technology (KAUST), Saudi Arabia

D-95 MetalJet Technology and Applications in XRD and SCD
E. Espes*, J. Hållstedt, U. Lundström, B.A.M. Hansson, O. Hemberg, M. Otendal, T. Tuohimaa, P. Takman, Excillum AB, Kista, Sweden

D-98 Metals & Alloys Structure Types in the PDF4+ - A Progress Report                 
P. Wallace , J. Dann, C. Foris, C. Hubbard*, H. Jones, A. Roberts, E. Ryba, ICDD Metals and Alloy Working Group

 

Post Deadline Posters:

D-97 WITHDRAWN Facile Synthesis of Sb2(S1-xSex)3 Solid Solution by Single Molecular Precursor Route and Band Gap Tuning
M.D. Khan,* N. Revaprasadu, University of Zululand,  South Africa
M.A. Malik, University of Manchester, Manchester, UK

D-99 Preparation and Characterization of Fiber Textured Copper Thin Films
Q. Lin, University of California Irvine, Irvine, CA, USA

D-100 Order Parameters of OLED Thin Films Using GIWAXS
C. Lor*, A. Hexemer, Lawrence Berkeley National Lab, USA
K. Kearns, Y. Huang, J.C. Lin, DOW Chemical, USA

D-101 Estimation of Grain Size in Pharmaceutical Tablets by Two-Dimensional X-ray Diffractometry
N. Thakral*, Upsher Smith Lab LLC, USA
S. Thakral, R. Suryanarayanan,  University of Minnesota, USA

D-102    Application of Flash Processing to Plain Carbon Steel Sheet
T. Watkins*, B. Shassere, H. Wang, T. Muth, R. Dinwiddie, Oak Ridge National Laboratory, Oak Ridge, TN, USA
S.S. Babu, Department of Mechanical, Aerospace, and Biomedical Engineering, Knoxville, TN, USA
G. Cola, SFP Works LLC, Washington, MI, USA

 

XRF Poster Session – Tuesday Evening (Huntley Dining Room)


The Tuesday evening XRF poster session will be held 5:00 pm – 7:00 pm
in the Huntley Dining Room, in conjunction with a wine and cheese reception.

Three "Best Poster" awards will be given at the end of the session, including "Best Student Poster".

Judges: M. Loubser, GeoMagGeoChem, South Africa, maggi.loubser@gmail.com
             M. Schmeling, Loyola University Chicago, USA, Mschmel@luc.edu

*Signifies presenting author, when noted

F-2 XRF Elemental Analysis from Raw Materials to Coated Carbides - Case of Kennametal. Inc
P. Kalvala, A. Comar, B. Sargent, T. Shibata*, Kennametal Inc., USA

F-3 Rapid Quantitative Analysis of Silicon, Calcium, Chromium, Manganese and Iron in Ferrosilicon by Benchtop EDXRF
D.W. Cheng*, M.B. Liu, X.L. Liao, Z.Y. Ni, X.J. Shen, Y.H. Jia, NCS Testing Technology Co., Ltd., China

F-4 Depth Resolved Chemical Speciation of a Superlatice
G. Das, M.K. Tiwari, Raja Ramanna Centre for Advanced Technology, and Homi Bhabha National Institute, India
A. Khooha, A.K. Singh, Raja Ramanna Centre for Advanced Technology, India

F-7 Recent Modifications to the Software of a Miniature X-ray Fluorescence Spectrometer for Radiological Glovebox Applications
D.M. Missimer*, P.E. O'Rourke, C.E. Brown, Savannah River National Laboratory, USA

F-12 Elemental Mapping of Strontium in Rat Bones Treated with Strontium Ranelate and Strontium Citrate using 3D Dual Energy X-ray K-edge Subtraction Imaging
D.A. Cardenas, A. Pejovic-Milic*, Ryerson University, Canada
D. Cooper, A. Panahifar, University of Saskatchewan, Canada
G. Wohl, McMaster University, Canada

F-16 Versatile Filtering of Charge Sharing in Commercial sCMOS Camera for X-ray Fluorescence Analysis
W. Zhao, University of Tsukuba, Japan
K. Sakurai, National Institute for Materials Science, Japan

F-18 X-ray Analysis of Fouling from CFBC
Y. Kim*, Korea Advanced Institute of Science and Technology, Republic of Korea
K. Park, J. Park, G. Lee, D. Lee, H. Kim, D. Bae, K. Han, D. Shun, Korea Institute of Energy Research, Republic of Korea

F-20 A New Scale in the Technology of Polycapillary Optics
A. Bjeoumikhov; S. Bjeoumikhova; M. Thiel, IFG / Fischer Technology, Inc., Germany

F-21 Characterization of Food Contaminants through Micro-XRF
R. Novetsky, Bruker AXS, Inc., USA

F-23 Investigating the Effects of Micro-XRF Analysis on Common Geochemical Compounds
S. Menachekanian, California State Polytechnic University, USA
D. Flannery, R. Hodyss, A. Allwood, K. Williford, Jet Propulsion Laboratory, USA
C. Heirwegh, Caltech/Jet Propulsion Laboratory, USA
C.S. Jamieson, Glendale Community College, USA

F-28 Characterization of Sub-Log Scale Variability in Mudstones and the Effects of Variable Sampling Scales on High Resolution Models; Examples from Bone Spring Formation, West Texas
A. Morrell*, S. Narasimhan, H. Rowe, P. Mainali, Premier Oilfield Laboratories, USA

F-29 WITHDRAWN X-ray Fluorescence Analysis in an Electron Microscope: Improved Spotsize of Polycapillary Focusing Optics at the IfG Modular X-ray Source (iMOXS/2®)
M. Menzel, A. Bjeoumikhov, IfG - Institute for Scientific Instruments GmbH, Germany

F-30 All-new Versatile Silicon Drift Detector and Preamplifier Combination for Industrial Applications
E. Lechner, R. Fojt, J. Knobloch, C. Luckey, A. Pahlke, S. Pahlke, N. Willems*, KETEK GmbH, Germany

F-35 Sample Preparation for TXRF Analysis using Resist Pattern Technique
K. Tsuji, N. Yomogita, Osaka City University, Japan
Y. Konyuba, JEOL, Japan

F-36 Diamond X-ray Lens Development
R. Kostin, Euclid Techlabs, USA

F-37 Electrodeless, Non-invasive X-ray Flux Monitor
S. Kuzikov, Euclid Techlabs, USA
A. Vikharev, Institute of Applied Physics, Russia
S. Stoupin, Chess, Cornell University, USA

F-57 PWM Implementation of a Grid Controlled Microfocus X-ray Tube
C. McKenzie, A. Degtraryov, Y. Alivov, M. Chidambaram, B. Grigsby, Oxford Instruments, USA

F-38 WITHDRAWN MOXTEK MXDPP-60: OEM DPP Performance Characterization
A. Stratilatov, R. Creighton, J. Van Wagoner, C. Carter, J. Wong, S. Kamtekar, Moxtek, Inc., USA

F-44 Silicon Drift Detectors for High Speed X-ray Applications
M. Zhang, S. Barkan, V.D. Saveliev, L. Feng, Y. Wang, B. Goolsby, E.V. Damron, Hitachi High-Technologies Science America, Inc., USA

F-45 Calculation of Fluorescent X-ray Intensity for Confocal micro-XRF Analysis of Inhomogenious Samples – Part 2
N. Kawahara*, R. Hosomi, S. Mita, K. Tsuji, Osaka City University, Japan

F-50 WITHDRAWN 120 kV & 5 Watt Compact X-ray Source
S. Cornaby, G. Smith, R. Steck, B. Harris, K. Kozaczek, E. Miller, S. Kamtekar, Moxtek Inc., USA

F-51 On-line Determination of Rare Earth Distribution by Energy Dispersive X-ray Fluorescence Spectrometry
L. Hongwei, Beijing, China

F-52 X-ray Fluorescence Computed Tomography at SSRF
B. Deng, B. Feng, G. Du, H. Xie, T. Xiao, SSRF, China

F-54 Differentiation and Quantification of Sulfur Species by X-ray Fluorescence (WDX)
S. Uhlig, A. Plessow, TU Bergakademie Freiberg, Germany
R. Möckel, Helmholtz-Institute Freiberg for Resource Technology, Germany

F-58 Novel Clustering Approach for the Segmentation of Elemental Distributions in Human Bone
M. Rauwolf*, A. Turyanskaya, P. Wobrauschek, C. Streli, Atominstitut - TU Wien, Austria
A. Roschger, Max Planck Institute of Colloids and Interfaces, Germany
P. Roschger, Hanusch Hospital, Austria
J.G. Hofstaetter, Orthopaedic Hospital Vienna-Speising, Austria

F-61 Application of SR-TXRF-XANES for the Analysis of Indoor Aerosol Samples at BESSYII and ELETTRA
J. Prost, A. Zinkl, D. Ingerle, P. Wobrauschek, C. Streli, Atominstitut - TU Wien, Austria
D.M. Eichert, W.H. Jark, ELETTRA – Sincrotrone Trieste, Italy
G. Pepponi, Fondazione Bruno Kessler, Italy
A. Migliori, A.G. Karydas, M. Czyzycki, International Atomic Energy Agency, Austria
A. Guilherme Buzanich, U. Reinholz, H. Riesemeier, M. Radtke, Federal Institute for Materials Research and Testing, Germany

F-62 Total-reflection X-ray Fluorescence Analysis of Airborne Particulate Matter Samples
A. Zinkl, J. Prost, J.H. Sterba, P. Wobrauschek, C. Streli, Atominstitut - TU Wien, Austria

F-65 Comparison of Synchrotron-Induced X-ray Fluorescence with ED-XRF on the Elemental Analysis of Air Pollution Samples
N. Spada, S. Yatkin, K. Trzepla, N. Hyslop, University of California, Davis, USA
M. Czyzycki, IAEA, Austria and AGH University of Science and Technology, Poland

F-66 Determination of Airborne Mercury using Ag-nano Particles Assisted TXRF
S. Böttger, D. Rosenberg, M. Busker, W. Jansen, Europa-Universität Flensburg, Germany
I.M.B. Tyssebotn, U.E.A. Fittschen*, Washington State University, USA

F-67 Interlaboratory Comparison of Reference Materials and Air Samples Analyzed by XRF and ICP-MS
S. Yatkin, K. Trzepla, V. Celo, W. White, N. Hyslop, University of California, Davis, USA
E. Dabek-Zlotorzynska, Environment and Climate Change Canada, Canada

F-68 Measuring Ultra-Low Phosphorus in Gasoline
J. Sedlmair, Bruker AXS Inc., USA

F-69 Implementation of a Confocal SR-microXRF System for Bone Analysis at the X-ray Fluorescence Beam Line at Elettra
A. Turyanskaya, L. Perneczky, M. Rauwolf, P. Wobrauschek, C. Streli, Atominstitut - TU Wien, Austria
D. Eichert, F. Brigidi, W. Jark, Elettra Sincrotrone Trieste, Italy
S. Bjeoumikhova, IFG, Institute for Scientific Instruments GmbH, Germany
G. Pepponi, Fondazione Bruno Kessler, Italy
P. Roschger, Hanusch Hospital, Austria

F-70 Investigation of the Local Manganese Distribution in Bone in Female and Male Osteoporosis Compared to Healthy Controls
A. Turyanskaya*, M. Rauwolf, T. Bretschneider, P. Wobrauschek, C. Streli, Atominstitut, TU Wien, Austria
A. Roschger, J. Hofstaetter, P. Roschger, Hanusch Hospital, Austria
J. Hofstaetter, Orthopaedic Hospital Vienna-Speising, Austria
I. Zizak, Helmholtz-Zentrum Berlin für Materialien und Energie, Germany

F-72 XRF Result Repeatability Across Multiple Uncalibrated Instrument Components
J. Van Wagoner, S. Cornaby, S. Kamtekar, K. Kozaczek, Moxtek, USA

F-75 Visualizing Artist's Techniques through Macro-XRF Scanning of Painted Works
D. MacLennan*, C. Schmidt Patterson, L. Lee, N. Daly, K. Trentelman, Getty Conservation Institute, USA
Y. Szafran, N. Turner, J. Paul Getty Museum, USA

 

F-76 Development of a Novel CE-XRF System for the Determination of Elemental Contaminants and Their Speciation in Complex Water Systems
I.M.B. Tyssebotn, A. Fittschen*, U.E.A. Fittschen, Washington State University, USA

F-77 In-vivo Micro-XRF to Study Rubidium Uptake in Plants
U.E.A. Fittschen, A. Fittschen*, R. Hoehner, H.-H. Kunz, Washington State University, USA

F-79 WITHDRAWN On-line Analysis of Potassium Chloride on a Conveyor Belt using XRF Combined with Distance Correction Method
X. Zhang, Y. Zhang, Z. Kong, Q. Shan, W. Jia, Nanjing University of Aeronautics and Astronautics, China

F-82 Total Reflection X-ray Fluorescence Analysis of Oysters
L. Borgese*, R. Dalipi, L.E. Depero, University of Brescia, Italy

F-83 WITHDRAWN Optimized High Energy Performance of Polycapillary Optics for μXRF Analysis
J. Sachs, N. Gao, XOS, USA
R. Magyar, Bowman XRF, USA

F-84 Use of Multivariate Analysis for Detecting Orientation Changes in Steel Via Laue Diffraction Artifacts within XRF Spectra
M.A. Rodriguez*, M.H. Van Benthem, J.J.M. Griego, D.F. Susan, P. Yang, C.D. Mowry, D. Enos, Sandia National Laboratories, USA

F-85 WITHDRAWN Chemical and Structural Analysis of Slags from Steel making Industries
A. Riboldi, M. Brisotto, L. Borgese*, G. Cornacchia, L.E. Depero, University of Brescia, Italy
E. Bemporad, University of Roma Tre, Italy

F-86 Measure Low Concentrations of As, Se and Pb in Water by MWDXRF
X. Zhang, T. Tongue, Z. Chen, X-ray Optical Systems, USA

F-87 New Reference Samples for X-ray Spectrometry
R. Dietsch*, T. Holz, M. Krämer, D. Rogler, D. Weissbach, AXO DRESDEN GmbH, Germany
B. Beckhoff, P. Hoenicke, PTB, Germany
T. Krugmann, University of Hamburg, Germany
D. Rosenberg, University of Flensburg, Germany

S-32 Study of Carbon Bonding with XES using a TES Microcalorimeter Detector
K. McIntosh*, G. Havrilla, M. Croce, R. Huber, D. Podlesak, M. Rabin, Los Alamos National Laboratory, USA F. Vila, University of Washington, USA M. Carpenter, R. Cantor, Star Cryoelectronics, USA

S-59 WITHDRAWN Alpha Particle X-ray Spectrometer onboard Chandrayaan-2 Rover
A. Patel, Physical Research Laboratory, India

Post Deadline Posters:

F-89  Matrix Correction For Improving the Calibration Accuracy of FP Model
X. Chen*, P. Hardman, Olympus, USA
J. Habermehl, Olympus, Canada

F-90  The Energy Dispersive Scheme of X-Ray Fluorescence Analysis with a Crystal Polarizer and Polycapillary Optics
A.G. Turyanskiy, V.M. Senkov, P.N. Lebedev Physical Institute RAS, Russian Federation
S.S.* Gizha, Ya.M. Stanishevskiy, RUDN University, Russian Federation

F-91 Development of Portable XRF, XRD and XRT, and Introduction of 2-Dimensional Detectors with Small Pixel Size and High Energy Resolution
K. Nishihagi*, K. Tantrakarn, K. Taniguchi,  Techno-X Co., Ltd., Japan

F-92 New Developments in Multi-Sensor Silicon Drift Detectors
D. Redfern*, P. Smith, B. Daniel, M. Gray, RaySpec Ltd, UK

F-93  Macro-XRF scanner Study of Gold-Silver alloys by the Moche in the Tomb of the Lady of Cao
S. Ridolfi*, Ars Mensurae, Italy
R. Cesareo, Università di Sassari, Italy
A. Bustamante, Universidad Nacional Mayor de San Marcos, Perù
R.F. Jordan, A. Fernandez,, PACEB Museo Cao e Fundacion Wiese, Peru
S. Azeredo, R.T. Lopes, COPPE, Universidade Federal do Rio de Janeiro, Brasil
G.E. Gigante, SBAI Sapienza University, Italy

F-94  Advantages and Disadvantages of Micro-XRF Spectrometry in Numismatic Research
J.M. del Hoyo, M. Matosz,The National Museum in Krakow, Poland

Plenary Session – Wednesday Morning, 2 August - 8:30 am – 11:45 am
(Talus Room)

Inspecting the Infrastructure – Safeguarding with X-rays

Chairs: C. Murray, IBM T.J. Watson Research Center, USA, conal@us.ibm.com
D. Broton, CTLGroup, USA, dbroton@ctlgroup.com

 

8:30

 

Welcoming Remarks & Awards:
Introduction of the new Chairman of the Denver X-ray Conference, Tim Fawcett, Emeritus ICDD, USA, by Past Chairman, W. Tim Elam, University of Washington, USA

2017 Jenkins Award presented to James Kaduk, Polycrystallography, Inc and Illinois Institute of Technology, USA. Presented by Tim Fawcett, Chairman of the Jenkins Award Selection Committee, Emeritus, ICDD, USA

2017 Barrett Award presented to Daniel Louër, France. Presented by Conal Murray, Chairman of the Barrett Award Selection Committee, IBM, USA. Dr. Louër will be unable to attend DXC and will accept the award at the ICDD Annual Meetings in 2018.

2017 Jerome B. Cohen Student Award winner to be announced by Chairman of the Cohen Award Selection Committee, I. Cev Noyan, Columbia University, USA

2017 Robert L. Snyder Student Awards to be announced by Tom Blanton, Executive Director, ICDD, USA

2017 ICDD Fellow Award presented to Thomas R. Watkins, Oak Ridge National Laboratory, USA.
Presented by Tom Blanton, Executive Director, ICDD, USA

Plenary Session remarks by the Chairs, Conal Murray and Don Broton

Invited Talks READ MORE ABOUT THE SPEAKERS

9:00

P-3

Hydraulic Cements for Construction: Cementitious Materials, Standards, Specifications, and X-ray Analysis P. Stutzman, National Institute of Standards and Technology, Gaithersburg, MD, USA

9:45

P-2

The Role of Chemistry in Materials Verification and Troubleshooting
G. Seegebrecht, Concrete Consulting Engineers, LLC, West Chester, IL, USA

10:30

 

Break

11:00

P-1

Neutron Diffraction and the Art of Infrastructure Maintenance
I.C. Noyan, Columbia University, New York, NY, USA

 

Oral Sessions – Wednesday Afternoon

*Signifies Presenting Author, when noted

New Developments in XRD/XRF Instrumentation I - North Mammoth
Chairs: T.N. Blanton, International Centre for Diffraction Data, USA, tblanton@icdd.com
T. Fawcett, Emeritus, International Centre for Diffraction Data, USA, dxcfawcett@outlook.com
1:30-1:42 S-4 Geometry and Algorithms to Expand 2theta Coverage of 2D Detector
B. He, Bruker AXS, USA
1:43-1:55 S-15 Simultaneous X-ray Fluorescence and Diffraction Imaging with the Color X-ray Camera
J. Davis*, J. Schmidt, M. Huth, H. Soltau, PNDetector, Germany
R. Hartman, L. Strüder, PNSensor, Germany
1:56-2:08 S-16 STOE STADI P and the MULTI-MYTHEN – Fastest Data Collection, Not Only for In-Situ Experiments
T. Hartmann, Stoe & Cie GmbH, Germany
2:09-2:21 S-43 Latest Development of Multilayer Optics for Analyzers and Probe Beam Solutions at Rigaku Innovative Technologies
N. Grupido, B. Verman, Y. Platonov, L. Jiang, Rigaku Innovative Technologies, Inc., USA
2:22-2:34 S-56 Pixirad: Unique Hybrid Pixel Technology for X-ray Diffraction, Scattering and Imaging
M. Fransen*, A. Noordermeer, E. Reuvekamp, R. de Vries, J. Bolze, F. Masiello, PANalytical B.V., The Netherlands
A. Brez, M. Minuti, M. Pinchera, G. Spandre, Pixirad srl and Istituto Nazionale di Fisica Nucleare, Italy
R. Bellazzini, PANalytical, Pixirad and INFN, Italy
2:35-2:47 S-8 Improved Performance of Silicon Drift Detectors
A. Pahlke*, R. Fojt, M. Fraczek, L. Höllt, J. Knobloch, N. Miyakawa, J. Rumpff, O. Scheid, A. Simsek, KETEK GmbH, Germany
2:48-3:00 S-9 New Developments in ED-XRF Technology Enable Highly Precise Elemental Analyses
D. Sachter, D. Wissmann, SPECTRO Analytical Instruments GmbH, Germany
M. Daniel-Prowse*, SPECTRO Analytical Instruments Inc., USA
3:00 Break  
3:30-3:42 S-18 More Features, Improved Integration, HighScore(Plus) V4.6 and Beyond
T. Degen, M. Sadki, E. Bron, PANalytical B.V., Netherlands
3:43-3:55 S-48 Fast X-ray Sorting for Recycling Light Metals: A Low Cost High Throughput In-Line X-ray Fluorescence Scrap Metal Sorter
M. Garcia, N. Kumar, nanoRANCH-UHV Technologies, Inc., USA
3:56-4:08 S-53 New Innovations in the D2 PHASER Benchtop Diffractometer
B. Jones*, N. Henderson, S. Rodesney, J. Giencke, Bruker AXS, USA
A. Kern, Bruker AXS, Germany
4:09-4:21 S-23 Aeris- PANalytical's New Benchtop XRD with Best in Class Performance
J. Quinn, PANalytical Inc., USA
H. van Weeren, M. Fransen, PANalytical BV, The Netherlands
4:22-4:34 S-52 D8 ADVANCE Plus: The Newest Member of the D8 Family of Solutions
J. Giencke, B. Jones, N. Henderson, N. Rodesney, Bruker, USA
4:35-4:47 S-57 Improving Handheld XRF Performance in Geological Samples
M. Cameron, Bruker Elemental, USA
4:48-5:00 S-38 Newly Developed Compact X-ray Sources
S. Cornaby, T. Parker, R. Steck, B. Harris, K. Kozaczek, C. Smith, E. Miller, S. Kamtekar, Moxtek Inc., USA

 

Stress and Infrastructure - Amphitheatre
Chair: T.R. Watkins, Oak Ridge National Laboratory, USA, watkinstr@ornl.gov
1:30 D-92 Invited: Complementary Residual Stress Measurement Techniques
M.L. Steinzig*, M.B. Prime, T.A. Sisneros, B. Clausen, C.F. Chen, J. Dereskiewicz, Los Alamos National Laboratory, USA
2:00 D-49 Spatially Resolved Texture and Microstructure Evolution of Gas Gun Deformed SUS304 Steel Using Neutron Diffraction
S. Takajo*, C.P. Trujillo, D.T. Martinez, B. Clausen, D.W. Brown, S.C. Vogel, Los Alamos National Laboratory, USA
2:20 D-86 Precision and Accuracy of Stress Measurement with a Portable X-ray Machine
S.Y. Lee*, S. Wang, Columbia University, USA
J. Ling, J. Ramirez-Rico, Universidad de Sevilla, Spain
2:40 D-21 Asymmetrical Reciprocal Space Mapping using X-ray Diffraction: A Technique for Structural Characterization of III-nitride Nanostructures
A. Kuchuk, University of Arkansas, USA
3:00 Break  
3:30 D-87 Strain Determination in Nanoparticles
S. Xiong, I.C. Noyan, Columbia University, USA
  D-68 WITHDRAWN High-Energy Synchrotron Radiation X-ray Diffraction Measurements for Phase and Residual Strain Mapping of Friction-Stir Processed Beta Titanium Alloys
M. Carl, M.L. Young, University of North Texas, USA
3:50 D-20 Validation of the Material Removal Correction for Residual Stress Measurement Results Obtained Using X-ray Diffraction Techniques
J. Pineault*, M. Bolla, M. Belassel, Proto Manufacturing Ltd., Canada
M. Brauss, Proto Manufacturing Inc., USA
4:10 D-17 Residual Stress Measurement of Polyethylene Pipes with Two-Dimensional X-ray Diffraction
M. Ren, C. Zheng, Y. Shi, L. Liu, Sinopec Beijing Research Institute of Chemical Industry, China
B.B. He, Bruker AXS, Inc., USA

 

Rietveld - Lamar/Gibbon
Chair: A. Huq, Oak Ridge National Laboratory, USA, huqa@ornl.gov
2:00 D-13 Invited: The Impact of the Rietveld Method in Mineralogy and Geology: The Impossible is now Possible
D. Bish, Indiana University, USA
2:30 D-57 Routine Definition of K-feldspar Ordering Degree in Multiphase Rietveld Refinements
R. Möckel, S. Richter, J. Gutzmer, Helmholtz-Institute Freiberg for Resource Technology, Germany
U. Kempe, TU Bergakademie Freiberg, Germany
2:50 D-18 Invited: Powder Diffraction in the Petroleum and Petrochemical Industries
J.A. Kaduk, Illinois Institute of Technology and North Central College, USA
3:20 Break  
3:50 D-93 Invited: The Impact of Rietveld in Condensed Matter Science
C.R. Dela Cruz, Oak Ridge National Laboratory, USA
4:20 D-42 Synthesis and Structural Characterization of Small-pore ABC-6 Family Zeotypes
J.P.S. Mowat, G.J. Lewis, R.W. Broach, N. Greenlay, P. Jakubczak, L.M. Knight, S.R. Miller, J. Stanczyk, Honeywell UOP, USA
4:40 D-58 Understanding Reduction Alloying of Core-shell Nanoparticles Through In-situ Powder X-ray Diffraction
R. Koch, S. Misture, Alfred University, USA
G. Li, H. Wang, University of South Carolina, USA

 

Quantitative Analysis of XRF - South Mammoth
Chair: L. Brehm, Dow Chemical Company, USA, llbrehm@dow.com
1:30 F-81 Invited: The Micro Ionome of Plants: An Approach to Quantify Ion Uptake and Distribution In Vivo
U.E.A. Fittschen, A. Fittschen, R. Hoehner, W. Tramel, H.H. Kunz, Washington State University, USA
2:00 F-22 Reduction of Pile-up Spectra at High Input Count Rates - Mandatory for Trace Element Analysis
J. Heckel, SPECTRO Analytical Instruments GmbH, Germany
2:20 F-33 Calibration of a μ-XRF Prototype Instrument used in Modelling the Performance of the Planetary Instrument for X-ray Lithochemistry (PIXL) for Mars 2020
C. Heirwegh, D. Flannery, A. Allwood, Jet Propulsion Laboratory, California Institute of Technology, USA
W.T. Elam, University of Washington, USA
2:40 F-80 Abridged Spectral Matrix Inversion – Fitting 25,000 Spectra Per Second
A.M. Crawford*, O. Ponomarenko, C. Simoens, G. George, I. Pickering, University of Saskatchewan, Canada
3:00 F-31 Where Compton Matters
T. Wolff*, F. Reinhardt, Bruker Nano GmbH, Germany
F. Nitsche, Bruker AXS GmbH, Germany
D. Docenko, Consultant, Israel
3:20 Break  
3:50   Invited: Some Aspects of Fundamental Parameters Applied to XRF
B. Vrebos, Panalytical B.V., The Netherlands
4:20 F-56 Invited: Superconducting Microcalorimeters for X-ray Spectroscopy
J. Fowler, NIST Boulder Labs, USA
  F-64 WITHDRAWN Research of Method for Improving the Accuracy of Online X-ray Fluorescence Analysis in Coal
Y. Zhang, W.B. Jia, Q. Shan, X.L. Zhang, Nanjing University of Aeronautics and Astronautics, China
R. Gardner, North Carolina State University, USA
4:50 F-47 XRF Analysis by FP Calibration Using Standards with Unknown Components
K. Kawakyu*, T. Moriyama, Y. Kataoka, Rigaku Corporation, Japan

Oral Sessions, Thursday Morning, 3 August

*Signifies presenting author, when noted

New Developments in XRD/XRF Instrumentation II - North Mammoth
Chairs: T.N. Blanton, International Centre for Diffraction Data, USA, tblanton@icdd.com
T. Fawcett, Emeritus, International Centre for Diffraction Data, USA, dxcfawcett@outlook.com
8:30-8:42 S-7 High-throughput X-ray Powder Diffraction System Consisting of Multiple MYTHEN Detectors at Beamline BL02B2 of SPring-8
K. Sugimoto*, S. Kawaguchi, M. Takemoto, Japan Synchrotron Radiation Research Institute, Japan
8:43-8:55 S-22 Computed Tomography Experiments on a Laboratory Multipurpose Diffractometer
D. Beckers*, N. Dadivanyan, D.J. Götz, M. Fransen, PANalytical, The Netherlands
8:56-9:08 S-51 Non-Invasive Identification of Pigments from XVI Century using an XRD/XRF System
V. Aguilar, J.L. Ruvalcaba, Universidad Nacional Autonoma de Mexico, Mexico
9:09-9:21 S-45 Renewed and Upgraded NIST SRMS for Powder Diffraction
J.P. Cline, D.R. Black, M.H. Mendenhall, A. Henins, NIST, USA
P.S. Whitfield, ORNL, USA
9:22-9:34 S-2 Current Status of the Liquid-Metal-Jet X-ray Source Technology
E. Espes, J. Hållstedt, B. Hansson, U. Lundström, P. Takman, O. Hemberg, M. Otendal, T. Tuohimaa, Excillum AB, Sweden
9:35-9:47 S-47 New User-Customized Calibrations for Handheld pXRF Analysers
C. Brand, Portable Analysers Australia, Australia
M. Cameron, Bruker Elemental, USA
9:48-10:00 S-34 Ultra High Speed Multi-element SDD X-ray Spectrometer with Improved Energy Response
Y. Wang, S. Barkan, L. Feng, V. Saveliev, M. Zhang, Hitachi High-Technologies Science America, Inc., USA
10:00 Break  
10:30-10:42 S-28 Advances in a Laboratory X-ray Analytical Microscope with micro X-ray Fluorescence Capabilities toward Significant Gains in Resolution and Sensitivity
W. Yun, B. Stripe*, S. Lewis, D. Reynolds, A. Lyon, J. Kirz, Sigray, USA
10:43-10:55 S-31 The Soft X-ray Microgap (MICROMEGAS) Gas Detector for WDXRF Spectrometers. Prototype Design and First Characterization Data
A. Stratilatov, R. Creighton, J. Barron, Moxtek, Inc., USA
Moved to XRF Poster Session S-32 Study of Carbon Bonding with XES using a TES Microcalorimeter Detector
K. McIntosh*, G. Havrilla, M. Croce, R. Huber, D. Podlesak, M. Rabin, Los Alamos National Laboratory, USA
F. Vila, University of Washington, USA
M. Carpenter, R. Cantor, Star Cryoelectronics, USA
10:56-11:08 S-60 Enhance the Quality of Your XRF Data by Using the Best Weighing Methods for Sample Preparation by Fusion
A.C. Breton*, Claisse, Canada
11:09-11:21 S-6 XRF Detector System with Hermetically Closed Silicon Drift Detector Modules for High Resolution Spectroscopy in Ambient Air Conditions
H. Schmidt, H. Soltau, A. Niculae, A. Liebel, R. Lackner, D. Steigenhöfer, B. Talbi, M. Bornschlegl, T. Barros, PNDetector GmbH, Germany
11:22-11:34 S-55 Phase Modification Descriptor in the Powder Diffraction File™
S. Kabekkodu*, International Centre for Diffraction Data (ICDD), USA
C. Crowder, Scientist-Emeritus, ICDD, USA
J. Dann, Consulting Editor, ICDD, USA
11:35-11:47 S-25 Energy Dispersive X-ray Diffraction to Answer the Question: "What's in the Box?"
S. Dorkings, Defence Science & Technology Laboratory - UK Ministry of Defence, UK
11:48-12:00 S-61 High Performance Detectors for X-ray Spectroscopy
R. Redus*, A. Huber, P. Kostamo, J. Kostamo, Amptek Inc., Bedford, MA, USA
  S-41 WITHDRAWN - Scanning Laue X-ray Nanodiffraction for Microstructural Imaging and Its Applications for Material Science
C.S. Ku, S.J. Chiu, C.Y. Chiang, National Synchrotron Radiation Research Center, Taiwan

 

Imaging I South Mammoth
Chair: P. Pianetta, Stanford University, USA, pianetta@slac.stanford.edu
Co-chair: Y. Liu, SLAC National Accelerator Laboratory, USA, liuyijin@SLAC.Stanford.edu
8:30 S-26 Invited: Dreaming in Cool Colors: X-ray Microscopy to See What's There, and to Know What it is
C. Jacobsen, APS - Argonne National Laboratory, and Northwestern University, USA
9:00 S-13 Realtime X-ray Fluorescence Movie of Calcium and Iron in Growing Chemical Garden
W. Zhao*, University of Tsukuba, Japan
K. Sakurai, National Institute for Materials Science, Japan
9:20 S-50 X-ray Fluorescence Tomography Developments for Studies of Challenging Samples
O. Antipova*, K. Kemner, S. Vogt, L.X. Li, D. Gursoy, Argonne National Laboratory, USA
9:40 S-30 Novel Microstructured X-ray Source Designed for Grating-Based Phase Contrast Imaging
W. Yun*, S. Lewis, D. Reynolds, B. Stripe, A. Lyon, S. Chen, S. Seshadri, V. Semenov, J. Kirz, Sigray, USA
10:00 Break  
10:30 S-54 Invited: Understanding Heterogeneities in Battery Materials through Multi-Modal X-ray Microscopy
W.E. Gent*, Y. Li, J. Lim, W.C. Chueh, Stanford University, USA
11:00 S-24 Zinc (Zn) and Lead (Pb) Accumulation in the Tidemark of Articular Cartilage with High-resolution micro-XRF
M. Rauwolf*, A. Turyanskaya, P. Wobrauschek, C. Streli, Atominstitut - TU Wien, Austria
A. Roschger, Max Planck Institute of Colloids and Interfaces, Germany
I. Pape, K. Sawhney, Diamond Light Source Ltd, UK
P. Roschger, Hanusch Hospital, Austria
J.G. Hofstaetter, Orthopaedic Hospital Vienna-Speising, Austria
11:20 S-39 Analyzing Challenging Materials with Micro-X-ray Fluorescence
C. Worley, Los Alamos National Laboratory, USA
11:40 S-20 Multimodal Imaging of Biological Samples: Correlation of μXRF with MALDI-MSI and with LA-ICP-MS
A. Turyanskaya*, M. Rauwolf, L. Perneczky, P. Wobrauschek, C. Streli, Atominstitut - TU Wien, Austria
A. Svirkova, M. Bonta, A. Limbeck, M. Marchetti-Deschmann, CTA - TU Wien, Austria
A. Roschger, P. Roschger, Hanusch Hospital, Austria

 

Mineral Exploration and Mining - Amphitheatre
Chair: D.L. Bish, Indiana University Bloomington, USA, bish@indiana.edu
8:30 S-5 Invited: Handheld XRD Methods for Mining and Related Applications
G. Hansford, University of Leicester, UK
9:00 S-10 Invited: Practical Applications of Portable XRF in Mineral Exploration: Confessions of a Geochemist
D. Arne, CSA Global, Canada
9:30 S-3 Detecting the Undetectable: Lithium by Portable XRF
N. Brand, Portable XRF Services and University of Western Australia, Australia
C. Brand, Portable XRF Services, Australia
9:50 F-17 Particle Size Effects in X-ray Fluorescence Analysis of Iron and Copper Minerals
B. Ganly*, J. Tickner, CSIRO, Australia
10:10 Break  
10:40 S-21 Invited: First Impressions Count: Applications of Field Portable X-ray Diffraction to Environmental Monitoring of Mine Sites
C.C. Turvey*, S.A. Wilson, J.L. Hamilton, Monash University, Australia
S.M. Jowitt, University of Nevada Las Vegas, USA
G. Southam, The University of Queensland, Australia
11:10 F-46 Mg-carbonate Cements Trap Potentially Toxic Trace Metals and CO2 at Woodsreef Mine, New South Wales
J.L. Hamilton*, S.A. Wilson, B. Morgan, C.C. Turvey, Monash University, Australia
D.J. Paterson, Australian Synchrotron, Australia
J. McCutcheon, G. Southam, The University of Queensland, Australia
11:30 F-78 Geochemical, Mineralogical, and Lithological Linkages in a Thick, Early Permian, Siliciclastic Succession, Midland Basin, West Texas, USA
A. Musgrove*, A. Morrell, P. Mainali, H. Rowe, N. Ganser, Premier Oilfield Laboratories, USA
11:50 S-33 Mineral Identification by Elemental Composition: A New Tool with PDF-4 Databases
T.G. Fawcett*, J.R. Blanton, S.N. Kabekkodu, T.N. Blanton, International Centre for Diffraction Data, USA

 

Polymers - Cheyenne Room
Chairs: B. Landes, Dow Chemical Company, USA, bglandes@dow.com
N.S. Murthy, Rutgers University, USA, murthy@biology.rutgers.edu
8:30 D-11 Invited: Novel Block Copolymer Morphologies Studied by GISAXS
K. Yager, Brookhaven National Laboratory, USA
9:00 D-29 Invited: SAXS Characterization of Nanocomposites and Polymer Matrix Composites
H. Koerner, Air Force Research Laboratory, USA
9:30 D-34 ICDD Full Diffraction Pattern Polymer Project – Applications in Pharmaceutical and Biomedical Materials
T. Blanton*, S. Gates-Rector, T. Fawcett, International Centre for Diffraction Data, USA
S. Misture, Alfred University, USA
9:50 D-40 Investigating Structures with Preferred Orientation Using X-ray and Neutron Scattering Techniques
Y. Mao, National Institute of Standards and Technology/University of Maryland, USA
10:10 Break  
10:40 D-82 Invited: X-ray Scattering at the Advanced Light Source
A. Hexemer, Lawrence Berkeley National Lab, USA
11:10 D-75 Morphological Changes in HMPE Fibers Induced from Transverse Pressures and its Application to the Study and Mapping of Ballistic Impacts on Unidirectional Laminates
S.T. Correale, Honeywell International, Inc., USA
11:30 D-43 An X-ray Pole Figure Analysis on BOPE Films with Sequential Biaxial Drawing
Y. Tang, J. Yin, L. Liu, SINOPEC, Beijing Research Institute of Chemical Industry, China
B.B. He, Bruker AXS, Inc., USA
11:50 D-53 Surface X-ray Scattering Study of Segregation of PEG in Polymers
W. Wang, W.R. Lindemann, D. Vaknin, Iowa State University, USA
N.S. Murthy*, Rutgers University, USA

 

General XRF and Environmental XRF - Lamar/Gibbon
Chairs: J. Kawai, Kyoto University, Japan, kawai.jun.3x@kyoto-u.ac.jp
R. Van Grieken, University of Antwerp, Belgium, rene.vangrieken@uantwerpen.be
8:30 F-11 Invited: Relation Between XANES Pre-edge and XRF Kβ5 as the Changes of Chemical State, Local Symmetry, and Coordination Number
T. Yamamoto, Tokushima University, Japan
9:00 F-32 Invited: XRF Related Activities at the IAEA Nuclear Science and Instrumentation Laboratory
A. Migliori*, R. Padilla-Alvarez, I. Darby, International Atomic Energy Agency (IAEA) Laboratories, Austria
J. Osan, IAEA Laboratories, Austria and Hungarian Academy of Sciences, Hungary
9:30 F-34 Extracting Further Information from an X-ray Fluorescence Spectrum through Modeling of X-ray Scattering
L.P. O'Neil*, D.C. Catling, W.T. Elam, University of Washington, USA
9:50 F-42 Leveraging XRF to Simplify Metals Analysis in Pharmaceuticals
S. Wood*, N. Lewen, M. Soumeillant, J. Qiu, J. Selekman, K. Zhu, Bristol-Myers Squibb, USA
10:10 F-55 3D-Polarized XRF Spectrometer with a 50kV and 4W X-ray Tube
T. Sugino, R. Tanaka, J. Kawai, Kyoto University, Kyoto, Japan
N. Shimura, RES Labo, Japan
10:30 Break  
11:00 F-13 Invited: Atmospheric Aerosol Characterization and Source Apportionment: The Key Role of X-ray Based Techniques
P. Prati, University of Genoa, Italy
11:30 F-1 The Advantages and Limitations of Handheld X-ray Fluorescence for Environmental Soil Screening
M. Kreiner, Oxford Instruments, USA
11:50 F-40 Mercury Telluride XRF Calibration Standards
S.K. Zeisler*, V. Jaggi, I. Kaur, H.K. Oberoi, Micromatter Technologies Inc., Canada
12:10 F-71 Wasted Streams: The Downstream Legacy of Mine Waste from Derelict Mines
D.B. Gore*, K.A. Fryirs, T.J. Ralph, Macquarie University, Australia

Oral Sessions, Thursday Afternoon, 3 August

*Signifies presenting author, when noted

Imaging II - South Mammoth
Chair: P. Pianetta, Stanford University, USA, pianetta@slac.stanford.edu
Co-chair: Y. Liu, SLAC National Accelerator Laboratory, USA, liuyijin@slac.stanford.edu
1:30 S-29 Invited: In-situ and Multi-modal X-ray Microscopy in Heterogeneous Catalysis
F. Meirer, Utrecht University, The Netherlands
2:00 S-14 X-ray Fluorescence Imaging of Buried Interface
W. Zhao, University of Tsukuba, Japan
K. Sakurai, National Institute for Materials Science, Japan
2:20 S-37 Sparse Macro-XRF Imaging of Large Works of Art
G. Pastorelli*, E. Pouyet, Q. Dai, O. Cossairt, A. Katsaggelos, M. Walton, Northwestern University, USA
2:40 S-27 Wavelength-Dispersive XRF Imaging Using Soller Slits and 2D Detector
K. Tsuji*, S. Aida, M. Yamanasghi, Osaka City University, Japan
T. Sakumura, K. Matsushita, T. Shoji, N. Kawahara, Rigaku, Japan
3:00 Break  
3:30 S-40 Multi-Model X-ray Microtomography for In-Situ Structure Quantification and Analysis
T. Xiao*, H. Xie, B. Deng, G. Du, R. Chen, G. Zhou, Y. Ren, Y. Wang, H. Tan, Y. Yang, L. Xu, T. Hu, Shanghai Institute of Applied Physics, China
3:50 S-42 Bragg Diffraction Transmission Microscopy Using Highly Monochromatic X-rays
S. Stoupin*, A. Campello, CHESS - Cornell University, USA
T. Kolodziej, A. Said, Y. Shvyd'ko, APS - Argonne National Laboratory, USA
4:10 S-17 The Lyncean Compact Light Source: A Miniature Synchrotron for your Laboratory
M. Feser*, R. Ruth, R. Loewen, Lyncean Technologies, USA

 

Applied Materials I - North Mammoth
Chairs: T.N. Blanton, International Centre for Diffraction Data, USA, tblanton@icdd.com
T. Fawcett, Emeritus, International Centre for Diffraction Data, USA, dxcfawcett@outlook.com
1:30 D-5 Invited: Crystal Structure Determination of Corrosion Products on Heritage Objects
S. Bette, R.E. Dinnebier*, Max-Planck-Institute for Solid State Research, Germany
G. Eggert, A. Fischer, Academy of Art and Design, Germany
2:00 D-69 Molecular Machinery Inside Crystalline Materials
V.N. Vukotic, University of Windsor and PROTO Manufacturing, Canada
2:20 D-76 Flash Sintering of Hydroxyapatite and Titania Composite Structures for Biomedical Applications
A. Choksi, T. Tsakalakos, H. Biçer, Rutgers University, USA
J. Okasinski, APS - Argonne National Laboratory, USA
2:40 D-62 Understanding the Mechanism of Flash Sintering with in situ EDXRD Experiments
S.K. Jha, T. Tsakalakos*, Rutgers University, USA
3:00 Break  
  D-37 WITHDRAWN Qualitative and Quantitative Monitoring of Early Age Hydration of Volcanic Ash Blended Cement Using XRF and XRD
A. Joseph*, S. Al-Bahar, J. Chakkamalayath, Kuwait Institute for Scientific Research, Kuwait
3:30 D-10 Methodology and Determination of Water in Important Hydration Phases of Cements Afm (LDH)-Sulfate, Carbonate, Hydroxide Phases
H. Poellmann, University of Halle, Germany
3:50 D-3 Influence of Amino Acids on the Crystallization of Calcium Silicates Hydrates
S. Witzleben, A. Leiendecker, M. Wenzel, Bonn-Rhein-Sieg University, Germany

 

General XRD - Amphitheatre
Chair: C. Murray, IBM T.J. Watson Research Center, USA, conal@us.ibm.com
1:30 D-22 High Throughput Combinatorial Studies of Thermoelectric Materials
W. Wong-Ng*, J. Martin, M. Otani, S. Barron, N. Nguyen, E.L. Thomas, K.R. Talley, NIST, USA
Y. Yan, Wuhan University of Technology, China
1:50 D-48 The Lattice Spacing Variability of Intrinsic Float-Zone Silicon
C.I. Szabo*, E.G. Kessler, J.P. Cline, A. Henins, L.T. Hudson, M.H. Mendenhall, M.D. Vaudin, NIST, USA
2:10 D-80 Electrical Properties and Crystallization Study of Indium Oxide Thin Films Via Grazing-Incidence Wide- Angle X-ray Scattering
G.B. Gonzalez*, J. Boesso, DePaul University, USA
J.S. Okasinski, J.D. Almer, Argonne National Laboratory, USA
D.B. Buchholz, L. Zeng, M.J. Bedzyk, R.P.H. Chang, Northwestern University, USA
  D-78 WITHDRAWN Characterization of XANES Spectra for Olivine Group Minerals as a Function of Orientation and Composition
N. Valdez, M. Gunter, University of Idaho, USA
M.D. Dyar, Mount Holyoke College, USA
2:30 D-89 Advancing Clinical Diagnosis of Bone Diseases using X-ray Diffraction
C. Greenwood*, K. Rogers, Cranfield University, UK
R. Scott, Gloucestershire Royal Hospital, UK
M. Wilson, Science and Technology Facilities Council, UK
2:50 D-91  Alloying Large Organic Cations into the Perovskite Framework for Enhanced Thermal Stability and Transport Properties
W. Peng, X. Miao*, O.M. Bakr, King Abdullah University of Science and Technology (KAUST), Saudi Arabia
3:10 Break

 

3:40 D-63 A Polycapillary Based Method of Monochromatic Time-Resolved X-ray Reflectivity
H. Joress*, J.D. Brock, A.R. Woll, CHESS - Cornell University, USA
4:00 D-79 Energy Dispersive Diffraction Imaging Using a New Germanium Strip Detector
J.S. Okasinski*, J.D. Almer, J. Baldwin, R. Woods, A. Miceli, O. Quaranta, APS - Argonne National Laboratory, USA
S.R. Stock, Northwestern University, USA
D.P. Siddons, NSLS-II - Brookhaven National Laboratory, USA
4:20 D-27 Synchrotron tts Microdiffraction: from Data Acquisition to Structure Solution
J. Rius*, CSIC-Institut de Ciència de Materials de Barcelona, Spain
O. Vallcorba, ALBA Synchrotron Light Source, Spain
4:40 D-41 X-ray Crystallography with the EIGER R 4M Large-area HPC Detector
M. Mueller*, A. Förster, C. Schulze-Briese, DECTRIS Ltd., Switzerland
5:00 D-44 Deconvolution-convolution Method
T. Ida, D. Hattan, Nagoya Institute of Technology, Japan
K. Nomura, Advanced Industrial Science and Technology, Japan

 

Trace Analysis including TXRF - Cheyenne
Chair: A. Pejovic-Milic, Ryerson University, Canada, anamilic@ryerson.ca
1:30 F-14 Invited: How to Establish a New Technique as a Standard: The Case of Total Reflection X-ray Fluorescence
L. Borgese*, L. Depero, University of Brescia, Italy
2:00 F-19 Invited: X-ray Fluorescence Measurement of Bone Pb In Vivo: A Review and Prospects for Improvement
D. Chettle, McMaster University, Canada
2:30 F-24 Detection of Localized Tungsten Deposition and Speciation in Bone using μXRF and μXANES
C.R. VanderSchee*, D. Kuter, D.S. Bohle, McGill University, Canada
2:50 F-25 A Movement Towards the use of Portable X-ray Analyzers for the in vivo Measurements of Lead and Strontium in Bone
E. Da Silva, A. Pejovic-Milic, Ryerson University, Canada
3:10 F-26 Total Reflection X-ray Fluorescence Based Method Development for Quantification of Gold Nanoparticles in Breast Cancer Cells
G. Mankovskii*, C. Yang, A. Pejovic-Milic, Ryerson University, Canada
D. Chithrani, University of Victoria, Canada
3:30 Break  
4:00 F-6 Confocal X-ray Fluorescence Microscopy Study on Plant Roots using Synchrotron Source
Z. Finfrock, Canadian Light Source Inc., Canada
S. Macfie, Western University, Canada
4:20 F-48 Perspectives and Opportunities in Plant and Food Science Research of Synchrotron Microscopy and Spectroscopy Techniques
D. Eichert, Elettra - Sincrotrone Trieste, Italy
4:40 F-41 Determination of Heavy Metals in Fruit Juices and Juice Blends by Total Reflection X-ray Fluorescence
M. Schmeling*, J. Arroyo, K. Niaz, P. Sreerama, G. Sukhera, Loyola University Chicago, USA
5:00 F-59 Trace Element Analysis of Airborne Particulate Matter with TXRF and SR-TXRF-XANES
J. Prost*, A. Zinkl, D. Ingerle, J.H. Sterba, P. Wobrauschek, C. Streli, Atominstitut - TU Wien, Austria
D.M. Eichert, W.H. Jark, Elettra – Sincrotrone Trieste, Italy
G. Pepponi, Fondazione Bruno Kessler, Italy
A. Migliori, A.G. Karydas, M. Czyzycki, International Atomic Energy Agency, Austria
A. Guilherme Buzanich, U. Reinholz, H. Riesemeier, M. Radtke, Federal Institute for Materials Research and Testing, Germany
5:20 F-73 Mercury Emissions Monitoring by TXRF
M. Garcia, N. Kumar, nanoRANCH-UHV Technologies, Inc., USA

Oral Sessions, Friday Morning, 4 August

*Signifies presenting author, when noted

Energy Storage Materials - Cheyenne
Chair: M.A. Rodriguez, Sandia National Laboratory, USA, marodri@sandia.gov
8:30 S-49 Invited: In-situ and Ex-situ Characterization of Lithium Ion Batteries using X-ray and Neutron Diffraction Methods
A. Payzant, Oak Ridge National Laboratory, USA
9:00 S-44 Short-range Distortions and Long-range Cubic Order in Barium Titanate Nanoparticles
T. Monson, Sandia National Labs, USA
R. Haskell, S.H. Bang, Harvey Mudd College, USA
C. Shi, S. Billinge, Columbia University, USA
  S-19 WITHDRAWN Crystal Structure in Bringing Excellent Electrochemical Properties in Alluaudite Type Sodium Insertion Materials
D. Dwibedi*, P. Barpanda, Indian Institute of Science, India
9:20 Break  
9:40 S-58 Invited: Characterization of Energy Storage Materials with Energy-Dispersive X-ray Diffraction: Challenges and Insights
W.A. Paxton, Ford Motor Company, USA
10:10 S-36 Development of a Novel sub eV, High Throughput, High Spatial Resolution, Laboratory X-ray Absorption Spectrometer for XANES and EXAFS Measurements
S. Seshadri, W. Yun. B. Stripe, D. Reynolds, A. Lyon, S. Lewis, J. Kirz, Sigray, Inc., USA

 

Applied Materials II - North Mammoth
Chairs: T.N. Blanton, International Centre for Diffraction Data, USA, tblanton@icdd.com
T. Fawcett, Emeritus, International Centre for Diffraction Data, USA, dxcfawcett@outlook.com
8:30 D-83 Invited: Characterization of Aluminum Alloys for Cylinder Heads
T.R. Watkins*, M. Frost, K. An, L.F. Allard, D. Shin, A. Sabau, A. Shyam, J.A. Haynes, Oak Ridge National Laboratory, USA
S. Roy, Oak Ridge National Laboratory, USA and Indian Institute of Technology, India
S. Mirmiran, Y. Liu, Fiat Chrysler Automobiles North America, LLC., USA
A.F. Rodriguez, A. Gonzalez, Nemak Monterrey, Mexico
9:00 D-12 In-situ XRD studies of Microstructural Changes in Steel
M. Witte, Salzgitter Mannesmann Forschung GmbH, Germany
I. Janssen, Georg-August University Göttingen, Germany
9:20 D-66 In-situ EDXRD Study of Flash Sintering of Zinc Oxide
H. Charalambous, S. Jha, T. Tsakalakos, M. Wassel*,Rutgers University, USA
9:40 Break  
10:00 D-74 Flash Sintering of Ultrahigh Melting Temperature Covalent Nonoxide Ceramics at Low Temperatures with Low DC Electric Fields "An in situ EDXRD Study with a 200 keV Synchrotron Probe"
T. Tsakalakos, Rutgers University, USA
10:20 D-45 Understanding Processing Induced Defects and Decomposition in PuO2, PuF4 and Uranium Alloys
L. Sweet*, M. McCoy, J. Corbey, A. Casella, S. Jana, V. Joshi, S. Sinkov, C. Delegard, J. Tingey, G. Lumetta, D. Meier, C. Lavender, K. Pitts, Pacific Northwest National Laboratory, USA
10:40 D-60 Flash Sintering of Bismuth Ferrite in situ with EDXRD
M. Wassel*, S. Jha, T. Tsakalakos, Rutgers University, USA
E. Gil-Gonzalez, L.A. Pérez-Maqueda, Instituto de Ciencia de Materiales de Sevilla, Spain

 

Pair Distribution Function - Amphitheatre
Chair: M.G. Tucker, Oak Ridge National Laboratory, USA, tuckermg@ornl.gov
8:30 D-23 Invited: New Developments in PDF Software: Automatic Processing and Complex Modelling
P. Chater*, D. Keeble, M. Wharmby, T. Spain, J. Filik, H. Wilhelm, Diamond Light Source, UK
9:00 D-55 X-ray PDF to Quantify Defects in Disordered 2-D MnO2 Nanosheet Assemblies
P. Metz, S. Misture, Alfred University, USA
9:20 D-54 X-ray Absorption Spectroscopy with Other Simulation Techniques to Work on Amorphous and
Nano-systems

Y. Zhang*, Oak Ridge National Laboratory, USA and Queen Mary, University of London, UK
A. Karatutlu, O. Ersoy, A. Sapelkin, Queen Mary, University of London, UK
9:40 Break  
10:00 D-28 Invited: Multi-technique Structural Refinements Using the RMC Method
I. Levin, National Institute of Standards & Technology, USA
10:30 D-59 Local Structural Distortions in the Boron Sublattice of Mixed Alkaline Earth Hexaborides Evidenced through Reverse Monte Carlo Modeling of X-ray Pair Distribution Functions
R.J. Koch*, P.C. Metz, S.T. Misture, Alfred University, USA
J. Cahill, O. Jaime, O. Graeve, University of California, USA
V.R. Vasquez, University of Nevada, Reno, USA
10:50 D-24 Application of Pair Distribution Function Analysis on Laboratory Diffractometer in the Temperature Range 80 – 1400 K
O. Narygina*, M. Sommariva, C.A. Reiss, M. Gateshki, M.J. Fransen, PANalytical B.V., The Netherlands
J. Quinn, PANalytical, Inc., USA
A. Pein, Anton Paar GmbH, Austria

 

Industrial Applications of XRF - South Mammoth
Chair: D. Broton, CTLGroup, USA, dbroton@ctlgroup.com
8:30 F-8 Applications of EDXRF Throughout the Food Industry
M. Kreiner, Oxford Instruments, USA
8:50 F-74 Online Real Time Metal Analysis during Pharmaceutical Manufacturing
M. Garcia, N. Kumar, nanoRANCH-UHV Technologies, Inc, USA
9:10 F-39 Industrial and Forensic Application of micro-XRF: Glass Analysis
S. Mamedov, Horiba Scientific, USA
9:30 F-63 Quality Control of Nanolayered Materials by XRR and GIXRF
D. Eichert, W. Jark, Elettra - Sincrotrone Trieste, Italy
9:50 Break  
10:10 F-10 Surface Finish Thickness Determination on Printed Circuit Boards Sub-structures using Conventional XRF
F. Bogani, Intel Corporation, USA
10:30 F-9 Microstructure Analysis of Cement-Based Materials using micro X-ray Fluorescence
A.B. Giorla, E. Tajuelo-Rodriguez, S. Curlin, Y. Le Pape, T.M. Rosseel, Oak Ridge National Laboratory, USA
A. Abd-Ellsamd, University of Tennessee, USA
10:50 F-60 A Chemostratigraphy-driven Workflow for the Analysis/Interpretation of Unconventional Core
H. Rowe, A. Morrell, P. Mainali, S. Narasimhan, N. Ganser, Premier Oilfield Laboratories, USA
11:10 F-43 Applications of Low Power Monochromatic WDXRF for Sulfur and Chlorine Analysis in Petroleum Industry - Overview and Recent Developments
Z.W. Chen, L. Johnson, XOS, USA

glance

 

Submit Abstract

Call for Papers is now Closed (except for Poster Presentations)

Abstracts are still being accepted for poster presentation only in the XRD or XRF poster sessions.

Poster sessions will be held on Monday (XRD)
and Tuesday (XRF) evening of conference week.

If you would like to be put on a waiting list for an oral presentation, please contact Denise Zulli: zulli@icdd.com. Thank you.

DXC in Big Sky