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Big Sky Resort, Big Sky, Montana, USA, 31 July – 4 August 2017


Call for Papers is now Closed Except for Poster Presentations

Abstracts are still being accepted for poster presentation only in the XRD or XRF poster sessions.

Poster sessions will be held on Monday (XRD) 
and Tuesday (XRF) evening of conference week.

(PDF)

Abstracts are hereby solicited for oral presentations in any of the sessions listed below, or the XRD and XRF poster sessions.
Poster sessions will be held on Monday (XRD) and Tuesday (XRF) evening of conference week.

Click here to view Sessions

Submit Abstract



Monday and Tuesday: WORKSHOPS


Special Topics in X-ray Analysis

Organizer(s)

Getting Started at User Facilities

S.H. Lapidus, APS – Argonne National Laboratory, Argonne, IL, USA

XRD

Organizer(s)

Specimen Preparation of XRD

T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA, USA

Rietveld – full day

To be announced

Stress

I.C. Noyan, Columbia University, New York, NY, USA
C. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY, USA

Polymers

B. Landes, Dow Chemical Company, Midland, MI, USA
S. Murthy, Rutgers University, Piscataway, NJ, USA

Strain & Phase Mapping of Industrial Materials & Processing by Synchrotron

T. Tsakalakos, Rutgers University, USA

XRF

Organizer(s)

Basic XRF

A. Drews, Ford Motor Company, Dearborn, MI, USA

Energy Dispersive

P. Lemberge, Thermo Fisher Scientific, Switzerland

Sample Preparation of XRF

J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI, USA

Micro XRF

K.C. Witherspoon, IXRF Systems, Inc., Austin, TX, USA

Quantitative Analysis – full day

W.T. Elam, University of Washington, Seattle, WA, USA
J.A. Anzelmo, Anzelmo & Associates, Inc., Madison, WI, USA

Trace Analysis including TXRF

P. Wobrauschek, C. Streli, TU Wien, Atominstitut, Vienna, Austria

Handheld XRF – The Silver Bullet or Fools Gold

M. Loubser, GeoMagGeoChem, Pretoria, South Africa

Challenges in XRF Analysis: Sample Preparation, Spectral Interpretation and Soft X-ray Detection

J. Kawai, Kyoto University, Kyoto, Japan
Y. Uehara, Mitsubishi Electric Corporation, Hyogo, Japan
S. Ichikawa, Fukuoka University, Fukuoka, Japan

AVAILABLE UNTIL 31 MARCH 2017 - For a summary of previous related workshop, "Uncertainty in XRF", please visit the following link: http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1097-4539/homepage/review_issue.htm

 

Wednesday, Thursday and Friday: SESSIONS**


Plenary

Chair(s) and Invited Speaker(s)

Inspecting the Infrastructure - Safeguarding with X-rays

C. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY, USA
D. Broton, Construction Technology Labs, Skokie, IL, USA

Diffraction and Infrastructure
I.C. Noyan, Columbia University, USA

Role of Chemistry in Concrete Materials Verification and Troubleshooting
G. Seegebrecht, Concrete Consulting Engineers, LLC., USA

Title to be announced
P. Stutzman, National Institute of Standards & Technology, USA

Special Topics in X-ray Analysis

Chair(s) and Invited Speaker(s)

New Developments in XRD/XRF Instrumentation – full day

T.N. Blanton, T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA, USA

Abstracts should be submitted by technical representatives of a manufacturer. They should discuss specifications, and applications concerning one of their newest and most important products. Talks should include comments about software, XRD and XRF equipment, and accessories. No mention of prices or
a comparison with competitors' products can be included.

Imaging

P. Pianetta, Stanford University, Menlo Park, CA, USA

Dreaming in Cool Colors: X-ray microscopy to see what's there, and to know what it is
C. Jacobsen, Argonne National Lab. and Northwestern University, USA

Imaging Nanoscale Dynamics in Lithium Ion Batteries

W. Chueh, Stanford University, USA

In-situ and Multi-modal X-ray Microscopy in Heterogeneous Catalysis
F. Meirer, Utrecht University, The Netherlands

Mineral Exploration and Mining

D. Bish, Indiana University, USA

Invited speakers: To be announced

Energy Storage Materials

M.A. Rodriguez, Sandia National Laboratory, Albuquerque, NM, USA

Characterization of Energy Storage Materials with X-ray Diffraction: Challenges and Perspectives
W. Paxton, Ford Motor Company, USA

In-situ and ex-situ Characterization of Lithium Ion Batteries using X-ray and Neutron Diffraction Methods
E.A. Payzant, Oak Ridge National Laboratory, USA

XRD

Chair(s) and Invited Speaker(s)

General XRD

C. Murray, IBM T.J. Watson Research Center, Yorktown Heights, NY, USA

Welcoming abstracts in all areas of X-ray diffraction and related techniques.

Stress and Infrastructure

T.R. Watkins, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Complementary Residual Stress Measurement Techniques
in Welded Pressure Vessels
M. Steinzig, Los Alamos National Laboratory, USA

Rietveld

A. Huq, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Understanding Complex Oxides using Neutron Powder Diffraction and Rietveld Analysis
D. Argyriou, European Spallation Source, Sweden

The Impact of Rietveld Methods in Mineralogy and Geology: The Impossible is Now Possible
D. Bish, Indiana University Bloomington, USA

Crystal Structures of Large-Volume Commercial Pharmaceuticals
J. Kaduk, Poly Crystallography, Inc. and Illinois Institute of Tech., USA

Applied Materials

T.N. Blanton, T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA, USA

Invited speakers: To be announced

Pair Distribution Function

M.G. Tucker, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Multi-technique Structural Refinements using the RMC Method
I. Levin, National Institute of Standards and Technology, USA

New Developments in PDF Software: Automatic Processing and Complex Modelling
P. Chater, Diamond Light Source Ltd., United Kingdom

Polymers

B. Landes, Dow Chemical Company, Midland, MI, USA
S. Murthy, Rutgers University, Piscataway, NJ, USA

Time-resolved Scattering Experiments on Nanocomposites of Hairy Nanoparticles and Gold Au Nanoparticles
H. Koerner, Air Force Research Laboratory, USA

GISAXS Measurements of Nanostructured Polymer Thin Films
K. Yager, Brookhaven National Laboratory, USA

Title to be announced
A. Hexemer, Lawrence Berkley National Laboratory, USA

   

XRF

Chair(s) and Invited Speaker(s)

General XRF

J. Kawai, Kyoto University, Kyoto, Japan

Relationship Between XANES Pre-edge and XRF kβ5 Correlated with Changes of Chemical State, Local Symmetry, and Coordination Number
T. Yamamoto, Tokushima University, Japan

XRF Related Activities at the IAEA Nuclear Science and Instrumentation Laboratory
J. Osan, A. Migliori, International Atomic Energy Agency, Austria

Quantitative Analysis of XRF

L. Brehm, Dow Chemical Company, Midland, MI, USA

Some Aspects of Fundamental Parameters Applied to XRF
B. Vrebos, PANalytical B.V., The Netherlands

The Micro-ionome of Plants: An Approach to Quantify Ion Uptake and Distribution In Vivo
U. Fittschen, Washington State University, USA

X-ray Metrology with Superconducting Microcalorimeters
J. Fowler, NIST Boulder Labs, USA

Industrial Applications of XRF

D. Broton, Construction Technology Labs, Skokie, IL, USA

Invited speakers: To be announced

Environmental XRF

R. Van Grieken, University of Antwerp, Antwerp, Belgium

Quantifying Vehicular Emissions on Ethanol-gasoline
Mixtures for Megacities in Brazil Janeiro, Brazil
P. Artaxo, University of São Paulo, Brazil

Atmospheric Aerosol Characterization and Source Apportionment: The Key Role of X-ray Based Techniques
P. Prati, University of Genoa, Italy

Trace Analysis including TXRF

A. Pejovic-Milic, Ryerson University, Toronto, ON, Canada

X-ray Fluorescence Measurement of Bone Pb In Vivo:
A Review and Prospects for Improvement
D. Chettle, McMaster University, Canada

How to Establish a New Technique as a Standard:
The Case of Total Reflection X-ray Fluorescence
L. Borgese, INSTM - University of Brescia, Italy

 

Submit Abstract

Call for Papers is now Closed Except for Poster Presentations

Abstracts are still being accepted for poster presentation only in the XRD or XRF poster sessions.

Poster sessions will be held on Monday (XRD)
and Tuesday (XRF) evening of conference week.

If you would like to be put on a waiting list for an oral presentation, please contact Denise Zulli: zulli@icdd.com. Thank you.

DXC in Big Sky